Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: A. Grill, E. Bury, J. Michl, S. Tyaginov, D. Linten, T. Grasser, B. Parvais, B. Kaczer, M. Waltl, I. Radu

Journal title: 2020 IEEE International Reliability Physics Symposium (IRPS)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-6

DOI identifier: 10.1109/irps45951.2020.9128316

ISBN: 978-1-7281-3199-3