On Correlation Between Hot-Carrier Stress Induced Device Parameter Degradation and Time-Zero Variability

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Authors: A. Makarov, Ph. Roussel, E. Bury, M. Vandemaele, A. Spessot, D. Linten, B. Kaczer, S. Tyaginov

Journal title: Proc. International Integrated Reliability Workshop (IIRW-2019), pp. 1-4

Journal publisher: IEEE

Published year: 2019

DOI identifier: 10.1109/iirw47491.2019.8989882