A mission profile-based reliability analysis framework for photovoltaic DC-DC converters

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Authors: W. Van De Sande, S. Ravyts, A. Sangwongwanich, P. Manganiello, Y. Yang, F. Blaabjerg, J. Driesen, M. Daenen

Journal title: Microelectronics Reliability

Journal number: 100-101

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 113383

DOI identifier: 10.1016/j.microrel.2019.06.075

ISSN: 0026-2714