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Authors: Luigi Capogrosso; Federico Cunico; Michele Lora; Marco Cristani; Franco Fummi; Davide Quaglia
Journal title: Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Journal publisher: IEEE
Published year: 2023
Published pages: 6
DOI identifier: 10.1109/ddecs57882.2023.10139711