Up-to Techniques for Branching Bisimilarity

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Authors: Rick Erkens, Jurriaan Rot, Bas Luttik

Journal title: SOFSEM 2020: Theory and Practice of Computer Science - 46th International Conference on Current Trends in Theory and Practice of Informatics, SOFSEM 2020, Limassol, Cyprus, January 20–24, 2020, Proceedings

Journal number: 12011

Journal publisher: Springer International Publishing

Published year: 2020

Published pages: 285-297

DOI identifier: 10.1007/978-3-030-38919-2_24

ISBN: 978-3-030-38918-5