Summary
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Authors: Jing Zhang; Clemens J. Kruckel; Bahawal Haq; Bozena Matuskova; Johanna Rimbock; Stefan Ertl; Agnieszka Gocalinska; Emanuele Pelucchi; Brian Corbett; Joris Van Campenhout; Guy Lepage; Peter Verheyen; Dries Van Thourhout; Roel Baets; Gunther Roelkens
Journal title: IEEE 72ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2022)
Journal number: 2
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/ectc51906.2022.00077
