Faster Attend-Infer-Repeat with Tractable Probabilistic Models

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Authors: Karl Stelzner, Robert Peharz and Kristian Kersting

Journal title: Proceedings of the 36th International Conference on Machine Learning (ICML)

Journal number: 36

Journal publisher: Proceedings of Machine Learning Research (PMLR)

Published year: 2019

Published pages: 5966--5975