An Interferometric Sensor for Scanning Microwave Microscopy Application

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Authors: Aleksandra Baskakova, Giuseppe Stella, Karel Hoffmann

Journal title: 2018 Asia-Pacific Microwave Conference (APMC)

Journal publisher: IEEE

Published year: 2018

Published pages: 1232-1234

DOI identifier: 10.23919/apmc.2018.8617173

ISBN: 978-4-9023-3945-1