Testability of Switching Lattices in the Stuck at Fault Model

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Authors: Anna Bernasconi, Valentina Ciriani, Luca Frontini

Journal title: 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)

Journal publisher: IEEE

Published year: 2018

Published pages: 213-218

DOI identifier: 10.1109/vlsi-soc.2018.8644806

ISBN: 978-1-5386-4756-1