A Fast Hill Climbing Algorithm for Defect and Variation Tolerant Logic Mapping of Nano-Crossbar Arrays

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Authors: Furkan Peker, Mustafa Altun

Journal title: IEEE Transactions on Multi-Scale Computing Systems

Journal number: 4/4

Journal publisher: IEEE

Published year: 2018

Published pages: 522-532

DOI identifier: 10.1109/tmscs.2018.2829518

ISSN: 2332-7766