Yield analysis of nano-crossbar arrays for uniform and clustered defect distributions

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Authors: Onur Tunali, Mustafa Altun

Journal title: 2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Journal publisher: IEEE

Published year: 2017

Published pages: 534-537

DOI identifier: 10.1109/icecs.2017.8292053

ISBN: 978-1-5386-1911-7