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Authors: Yujing Zhao, Zuobin Wang, Feng Hou, Yan Liu, Xinyue Wang, Yingmin Qu, Wenxiao Zhang, Yan Liu
Journal title: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
Journal publisher: IEEE
Published year: 2016
Published pages: 79-82
DOI identifier: 10.1109/3m-nano.2016.7824993
ISBN: 978-1-5090-2945-7
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