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Authors: Jixing Cai, Miao Yu, Yinxue Fan, Zuobin Wang, Yongqin Hao
Journal title: 2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
Journal publisher: IEEE
Published year: 2015
Published pages: 103-106
DOI identifier: 10.1109/3M-NANO.2015.7425516
ISBN: 978-1-4673-9625-7
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