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Authors: Y. Zheng, P. Smyrek, J.-H. Rakebrandt, H.J. Seifert, W. Pfleging, P. Smyrek, W. Pfleging, Ch. Kubel
Journal title: 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
Journal publisher: IEEE
Published year: 2017
Published pages: 61-64
DOI identifier: 10.1109/3m-nano.2017.8286308
ISBN: 978-1-5386-1081-7