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Authors: Meng Li, Xiaoping Zhang, Yaqing Tian, Jie Ren, Kyle Jiang, Jian Liu, Sai Priya Munagala, Kyle Jiang
Journal title: 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
Journal publisher: IEEE
Published year: 2017
Published pages: 74-78
DOI identifier: 10.1109/3m-nano.2017.8286326
ISBN: 978-1-5386-1081-7
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