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Authors: Xiubing Jing, Chengjuan Yang, Shuxian Zheng, Xinxiong Chen, Yuechao Zhao
Journal title: 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
Journal publisher: IEEE
Published year: 2018
Published pages: 10-13
DOI identifier: 10.1109/3m-nano.2018.8552196
ISBN: 978-1-5386-6214-4
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