​A setup for in-situ measurements of potential and UV induced degradation of PV modules inside a climatic chamber

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Authors: Stefan Mitterhofer, Marko Jankovec, Marko Topič

Journal title: International Conference on Microelectronics, Devices and Materials

Journal number: 53

Journal publisher: MIDEM Society for Microelectronics, Electronic Components and Materials

Published year: 2017

Published pages: 65-70

ISBN: 978-961-92933-7-9