Enhancing spatial resolution in MÖNCH for electron microscopy via deep learning

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Authors: Xie X, Barba Flores L, Bejar Haro B, Bergamaschi A, Fröjdh E, Müller E, Paton KA, Poghosyan E & Remlinger C

Journal title: Journal of instrumentation

Journal publisher: Institute of Physics

Published year: 2023

DOI identifier: 10.1088/1748-0221/19/01/c01020

ISSN: 1748-0221