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Authors: Koivusalo, E., Zia, N., Tuorila, H., Suomalainen, S., Koskinen, R., Viheriälä, J., & Guina, M
Journal title: ICMBE 2018 - the 20th International Conference on Molecular beam Epitaxy, Shanghai, China
Journal publisher: ICMBE
Published year: 2018