Optical Arbitrary Waveform Measurement (OAWM) Using Silicon Photonic Slicing Filters

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Authors: Fang, D.; Zazzi, A.; Mueller, J.; Dray, D.; Fullner, C.; Marin-Palomo, P.; Tabatabaei Mashayekh, A.; Dipta Das, A.; Weizel, M.; Gudyriev, S.; Freude, W.; Randel, S.; Scheytt, J.; Witzens, J.; Koos, C.

Journal title: IEEE Explore

Journal number: 07338724

Journal publisher: Optical Society of America

Published year: 2022

Published pages: pp. 1705-1717

DOI identifier: 10.1109/jlt.2021.3130764

ISSN: 0733-8724