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Authors: Christin Bobe, Ellen Van De Vijver, Johannes Keller, Daan Hanssens, Marc Van Meirvenne, Philippe De Smedt
Journal title: IEEE Transactions on Geoscience and Remote Sensing
Journal number: 58/5
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
Published pages: 3287-3297
DOI identifier: 10.1109/TGRS.2019.2953004
ISSN: 0196-2892