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Authors: Laura Rossi; Luiz Miranda de Lima; Yubo Sun; Frank Dehn; John Provis; Guang Ye; Geert de Schutter
Journal title: RILEM Technical Letters
Journal publisher: RILEM Publications
Published year: 2023
DOI identifier: 10.21809/rilemtechlett.2022.160
ISSN: 2518-0231