Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films

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Authors: Marek Stehlik, Goby Govindassamy, Janis Zideluns, Fabien Le Marchand, Frank Wagner, Julien Lumeau, Jacob Mackenzie, Laurent Gallais

Journal title: optical engineering

Journal number: 61

Journal publisher: S P I E - International Society for Optical Engineering

Published year: 2022

Published pages: 079801

DOI identifier: 10.1117/1.oe.61.7.079801

ISSN: 0091-3286