A Demo of FPGA Aggressive Voltage Downscaling: Power and Reliability Tradeoffs

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Authors: Behzad Salami, Osman Unsal, Adrian Cristal

Journal title: 2018 28th International Conference on Field Programmable Logic and Applications (FPL)

Journal publisher: IEEE

Published year: 2018

Published pages: 451-4511

DOI identifier: 10.1109/FPL.2018.00085

ISBN: 978-1-5386-8517-4