Fault Characterization Through FPGA Undervolting

Summary

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Authors: Behzad Salami, Osman Unsal, Adrian Cristal

Journal title: 2018 28th International Conference on Field Programmable Logic and Applications (FPL)

Journal publisher: IEEE

Published year: 2018

Published pages: 85-853

DOI identifier: 10.1109/FPL.2018.00023

ISBN: 978-1-5386-8517-4