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Authors: Dimitris Gizopoulos, George Papadimitriou, Athanasios Chatzidimitriou, Vijay Janapa Reddi, Behzad Salami, Osman S. Unsal, Adrian Cristal Kestelman, Jingwen Leng
Journal title: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Journal publisher: IEEE
Published year: 2019
Published pages: 129-134
DOI identifier: 10.1109/iolts.2019.8854386
ISBN: 978-1-7281-2490-2