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Authors: B. Salami, K. Parasyris, A. Cristal, O. Unsal, X. Martorell, P. Carpenter, R. De La Cruz, L. Bautista, D. Jimenez, C. Alvarez, S. Nabavi, S. Madonar, M. Pericas, P. Trancoso, M. Abduljabbar, J. Chen, P. N. Soomro, M Manivannan, M. Berge, S. Krupop, F. Klawonn, Al Mekhlafi, S. May, T. Becker, G. Gaydadjiev, H. Salomonsson, D. Dubhashi, O. Port, Y. Etsion, Le Quoc Do, Christof Fetzer, M. Kaiser, N.
Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2020
Published pages: 169-174
DOI identifier: 10.23919/DATE48585.2020.9116362
ISBN: 978-3-9819263-4-7
- Not specified