Summary
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Authors: Liang Zhang, Wenlong He, Jim Clarke, Kevin Ronald, Alan D. R. Phelps, Adrian W. Cross
Journal title: IEEE Transactions on Electron Devices
Journal number: 65/12
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 5499-5504
DOI identifier: 10.1109/ted.2018.2873726
ISSN: 0018-9383
