Summary
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Authors: D. Sabella, V. Sukhomlinov, L. Trang, S. Kekki, P. Paglierani, R. Rossbach, X. Li, Y. Fang, D. Druta, F. Giust, L. Cominardi, W. Featherstone, B. Pike, S. Hadad
Journal publisher: ETSI
Published year: 2019