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Authors: R. Haider, B. Marmiroli, I. Gavalas, M. Wolf, M. Matteucci, R. Taboryski, A. Boisen, E. Stratakis, H. Amenitsch
Journal title: Microelectronic Engineering
Journal number: 195
Journal publisher: Elsevier BV
Published year: 2018
Published pages: 7-12
DOI identifier: 10.1016/j.mee.2018.03.015
ISSN: 0167-9317