Metadata schema to support FAIR data in scanning electron microscopy

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Authors: R. Joseph, A. Chauhan, C. Eschke, A.Z. Ihsan, M. Jalali, M. U. Jäntsch, N. Jung, C.N. Shyam Kumar, C. Kübel, C. Lucas, M. Mail, A. Mazilkin, C. Neidiger, M. Panighel, S. Sandfeld, R. Stotzka, R. Thelen, R. Aversa

Journal title: Supplementary Proceedings of the XXIII International Conference on Data Analytics and Management in Data Intensive Domains (DAMDID/RCDL 2021): Moscow, Russia, October 26-29, 2021. Ed.: A. Pozanenko

Journal publisher: CEUR Workshop Proceedings

Published year: 2021

Published pages: 265-277

DOI identifier: 10.5445/ir/1000141604