BFL: a Logic to Reason about Fault Trees

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Authors: Nicoletti, Stefano M.; Hahn, E. Moritz; Stoelinga, Marielle

Journal title: 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)

Journal number: 31

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/dsn53405.2022.00051