Summary
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Authors: Jus Lozej, Dejan Stepec, Vitomir Struc, Peter Peer
Journal title: 2019 7th International Workshop on Biometrics and Forensics (IWBF)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-6
DOI identifier: 10.1109/iwbf.2019.8739225
ISBN: 978-1-7281-0622-9
