Method of samples preparation intended for research of deep centers in i-, n-, and p-layers of GaAs p + -pin-n + structures and result of analysis

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Authors: J. Toompuu, N. Sleptsuk, O. Korolkov, T. Rang

Journal title: 2016 15th Biennial Baltic Electronics Conference (BEC)

Journal publisher: IEEE

Published year: 2016

Published pages: 35-38

DOI identifier: 10.1109/BEC.2016.7743722

ISBN: 978-1-5090-1393-7