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Authors: Satyesh K. Yadav, Blas P. Uberuaga, Martin Nikl, Chao Jiang, Christopher R. Stanek
Journal title: Physical Review Applied
Journal number: 23317019
Journal publisher: American Physical Society
Published year: 2015
DOI identifier: 10.1103/PhysRevApplied.4.054012
ISSN: 2331-7019