Comparative study of transparent rectifying contacts on semiconducting oxide single crystals and amorphous thin films

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Authors: Alexander Lajn, Holger von Wenckstern, Marius Grundmann, Gerald Wagner, Pedro Barquinha, Elvira Fortunato, Rodrigo Martins

Journal title: Journal of Applied Physics

Journal number: 00218979

Journal publisher: American Institute of Physics

Published year: 2013

Published pages: 044511

DOI identifier: 10.1063/1.4789000

ISSN: 0021-8979