Calibrated microwave reflectance in low-temperature scanning tunneling microscopy

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Authors: Bareld Wit; Georg Gramse; Stefan Müllegger

Journal title: Review of Scientific Instruments

Journal number: 94

Journal publisher: AIP Publishing

Published year: 2023

Published pages: 103702

DOI identifier: 10.1063/5.0155029

ISSN: 1089-7623