Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Lobato Hoyos Ivan Pedro, De Backer A., Van Aert Sandra

Journal title: Ultramicroscopy

Journal number: 251

Journal publisher: Elsevier BV

Published year: 2023

Published pages: 113769

DOI identifier: 10.1016/j.ultramic.2023.113769

ISSN: 0304-3991