Atom counting from a combination of two ADF STEM images

Summary

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Authors: Sentürk Duygu Gizem, Yu C.P., De Backer A., Van Aert Sandra

Journal title: Ultramicroscopy

Journal number: 255

Journal publisher: Elsevier BV

Published year: 2024

Published pages: 113859

DOI identifier: 10.1016/j.ultramic.2023.113859

ISSN: 0304-3991