Deep convolutional neural networks to restore single-shot electron microscopy images

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Authors: Lobato Hoyos Ivan Pedro, Friedrich Thomas, Van Aert Sandra

Journal title: NPJ Computational Materials

Journal number: 10

Journal publisher: Springer Nature

Published year: 2024

Published pages: 1-19

DOI identifier: 10.1038/s41524-023-01188-0

ISSN: 2057-3960