Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions

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Authors: Zhang, Zezhong; Lobato, Ivan; De Backer, Annick; Van Aert, Sandra; Nellist, Peter

Journal title: Ultramicroscopy

Journal number: 246

Journal publisher: Elsevier BV

Published year: 2023

Published pages: 113671

DOI identifier: 10.1016/j.ultramic.2022.113671

ISSN: 0304-3991