Non-Profiled Side-Channel Assisted Fault Attack: A Case Study on DOMREP

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Authors: Sayandeep Saha, Prasanna Ravi, Dirmanto Jap, Shivam Bhasin

Journal title: 2023 Design, Automation & Test in Europe Conference & Exhibition

Journal number: 10137176

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.23919/DATE56975.2023.10137176

ISBN: 979-8-3503-9624-9