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Authors: S. Kumar , K. Geens , A. Vohra , D. Wellekens , D. Cingu , E. Fabris , T. Cosnier, H. Hahn , B. Bakeroot , N. Posthuma , R. Langer, and S. Decoutere
Journal title: IEEE Electron Device Letters
Journal number: Volume: 45, Issue: 4,
Journal publisher: IEEE
Published year: 2024
DOI identifier: 10.1109/LED.2024.3361164
ISSN: 0741-3106