Summary
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Authors: V. K. Papanikolaou, N. A. Mitsiou, P. -V. Mekikis, S. A. Tegos, P. D. Diamantoulakis and G. K. Karagiannidis
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/iccworkshops57953.2023.10283700