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Authors: Xin Li, Bin He, Zhipeng Wang, Yanmin Zhou, Gang Li, Rong Jiang
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal number: 70
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2022
DOI identifier: 10.1109/TIM.2021.3066542
ISSN: 0018-9456