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Authors: Iqbal, Masab; Ahmadian, Seyed Morteza; Velasco Esteban, Luis Domingo; Ruiz RamÃrez, Marc
Journal title: Crossref
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/icton59386.2023.10207324
ISBN: 979-8-3503-0303-2