Quantitative atomic cross section analysis by 4D-STEM and EELS

Summary

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Authors: Shahar Seifer, Lothar Houben, Michael Elbaum

Journal title: Ultramicroscopy

Journal publisher: Elsevier

Published year: 2024

DOI identifier: 10.1016/j.ultramic.2024.113936

ISSN: 0304-3991