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Authors: Fabian Orland, Kim Sebastian Brose, Julian Bissantz, Federica Ferraro, Christian Terboven, Christian Hasse
Journal title: 2022 IEEE/ACM International Workshop on Artificial Intelligence and Machine Learning for Scientific Applications (AI4S)
Journal number: 52
Journal publisher: IEEE
Published year: 2023
Published pages: 7-12
DOI identifier: 10.1109/ai4s56813.2022.00007