Basic block coverage for unit test generation at the SBST 2022 tool competition

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Authors: Derakhshanfar, Pouria; Devroey, Xavier

Journal title: Proceedings of the 2022 IEEE/ACM 15th International Workshop on Search-Based Software Testing (SBST)

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1145/3526072.3527528