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Authors: Derakhshanfar, Pouria; Devroey, Xavier; Perrouin, Gilles; Zaidman, Andy; Deursen, Arie Van
Journal title: 14th IEEE Conference on Software Testing, Verification and Validation (ICST)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/icst49551.2021.00039